Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy

Mechanical properties in crystals are determined by the arrangement of 1D line defects, termed dislocations. Recently, Dark field X-ray Microscopy (DFXM) has emerged as a new tool to image and interpret dislocations within using multidimensional scans. However, methods required reconstruct meaningful dislocation information from high-dimensional DFXM scans still nascent require significant manual oversight (i.e., supervision). In this work, we present relatively unsupervised method that extracts dislocation-specific (features) 3D dataset (x, y, $$\phi $$ ) Gram–Schmidt orthogonalization represent large an array 3-component feature vectors for each position, corresponding weak-beam conditions strong-beam condition. This offers key opportunities significantly reduce size while preserving only crystallographic is important data reconstruction.